By known methods and techniques of chemical-photographic processing silver halide photographic materials presented research electric-coalescence of atoms in microscopic silver halide him an example of X-ray photographs. It is shown that the developing agent as effective reducing agents in various combinations with each other and the other components of the developing solution to provide differential action centers of latent electric-field image depending on the morphology of the microcrystals AgHal, shaped voltage pulses of different polarities. The features of this action on the plate microcrystals AgHal hetero-contact type of X-ray film "Agfa", consisting in the absence of manifest differences electro-field images for bipolar pulses. Using known techniques locking surface mobility of the ions Ag+, separation images in the depth and surface components shown that Ag-centers electric-field of latent images are formed mainly on the surface only in terms of homogeneous microcrystals. In the case of T-crystal structure of the nuclear-film "Agfa" almost half of these centers are concentrated in their depths. Moreover, in the negative polarity voltage pulses share depth imaging is 45% more of the same image formed on the pulse of positive polarity. For the studied films "Agfa" and "PT-4sh" defined thresholds the electric field strength at which begins the formation of a reliable electric-image, that is effective clustering of silver atoms. Based on the results of the research laid the foundations of metrology electric-field for photos with specific parameters AgHal-films - electric-field sensitivity and electric-field exposure.

С помощью известных методов и технологий химико-фотографической обработки галогенсеребряных фотоматериалов представлены результаты исследований электрополевой коалесценции атомов серебра в микрокристаллах его галогенидов на примере электрополевых изображений, сформированных на рентгеновских фотоматериалах. Показана зависимость этого явления от габитуса и структуры кристаллитов, напряженности электрического поля в них, а также составов проявителей, восстанавливающих кластеры серебра до термодинамически-устойчивого состояния. Заложены метрологические основы способов оценки электрополевой чувствительности на примере названных кристаллов.