A sensor system for the scanning of parameters of thin metal films
UDC
53.082.53Abstract
A concept of scanning Surface Plasmon Resonance sensor system is presented. It has been shown that the analysis method and construction features of the sensor system make it possible to obtain information about the dielectric permittivity and thickness of a thin metal film on every its elementary section. The description of data operations is given for thin films measurements. The possibility of the system application in the chemical kinetic research is also pointed out.
References
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Dates
Submitted
January 10, 2006
Accepted
January 18, 2006
Published
March 30, 2006
How to Cite
[1]
Levchenko, A.S., Seryogina, N.N., A sensor system for the scanning of parameters of thin metal films. Ecological Bulletin of Research Centers of the Black Sea Economic Cooperation, 2006, № 1, pp. 92–95.
License
Copyright (c) 2006 Левченко А.С., Серёгина Н.Н.
This work is licensed under a Creative Commons Attribution 4.0 International License.
